Title:
A particulate detecting device and a security gate
Document Type and Number:
Japanese Patent JP5914164
Kind Code:
B2
Abstract:
In a conventional fine particle detection device that vaporizes fine particles attached to the object of examination by heating, processing capability decreases as the processing time elapses due to the influence of deposition of fine particles other than the object of examination, dirt/dust, a residue of the fine particles as the object of examination, or residual matter. A fine particle detection device according to the present invention includes: a vaporization device that vaporizes the fine particles trapped by a trap device by vaporization or decomposition; a first flow passageway in which a mixture of a component vaporized by the vaporization device and another component flows; a second flow passageway branching from the first flow passageway in a direction of inertial force acting on the other component; a third flow passageway branching from the first flow passageway in a direction different from the direction of the inertial force; and an analysis device that analyzes a component introduced into the third flow passageway.
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Inventors:
Masakazu Sugaya
Koichi Terada
Hideo Kashima
Yasuaki Takada
Hisashi Nagano
Koichi Terada
Hideo Kashima
Yasuaki Takada
Hisashi Nagano
Application Number:
JP2012117617A
Publication Date:
May 11, 2016
Filing Date:
May 23, 2012
Export Citation:
Assignee:
株式会社日立製作所
International Classes:
G01N15/00; G01N1/02; G01N1/22
Domestic Patent References:
| JP2005091118A | ||||
| JP2005181098A | ||||
| JP2007187467A | ||||
| JP2011085484A | ||||
| JP2011247609A | ||||
| JP2003130770A | ||||
| JP7505218A | ||||
| JP59175157U |
Foreign References:
| WO2012063796A1 |
Attorney, Agent or Firm:
Yusuke Hiraki
Sekiya Mitsuo
Toshiaki Watanabe
Sekiya Mitsuo
Toshiaki Watanabe