Title:
A production method of a shutter time lag measuring method, the display for shutter time lag measurement, and a camera
Document Type and Number:
Japanese Patent JP5994556
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To facilitate measurement of a shutter time lag in plural positions in a shutter movement direction.SOLUTION: In each group in which plural display elements positioned close to each other in a predetermined direction included in a display section are sorted, j display elements out of i first display elements are caused to be in a first display state, and i-j display elements are caused to be in a second display state to obtain a m-th display pattern. After a pattern continuation time Thas elapsed, k display elements out of the j display elements in the first display state are caused to be in the second display state, and the k display elements out of the i-j display elements in the second display state are caused to be in the first display state. Thus, a switching operation to switch to an m+1-th display pattern is sequentially made on each of the groups synchronously with each other and h second display elements display the progress of the switching operation in its own group. A shutter time lag in the respective groups is calculated based on the images in the display section taken by a camera the shutter movement direction of which is parallel to a predetermined direction in accordance with a shutter operation made synchronously with the switching operation.
Inventors:
Ryuichi Shiobara
Tatsuya Ichikawa
Tatsuya Ichikawa
Application Number:
JP2012226675A
Publication Date:
September 21, 2016
Filing Date:
October 12, 2012
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G03B15/00; G03B7/091; G03B17/38; G03B43/02; H04N5/222; H04N5/225
Domestic Patent References:
| JP2010206520A | ||||
| JP2002290979A |
Foreign References:
| US20080002029 |
Attorney, Agent or Firm:
Kazuaki Watanabe
Keisuke Nishida
Satoshi Nakai
Keisuke Nishida
Satoshi Nakai