Title:
A specimen observation method and a specimen viewing device
Document Type and Number:
Japanese Patent JP6218394
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a sample observation method and a sample observation device, which allow for observing a colorless transparent sample, such as cells, even in a bright-field observation mode.SOLUTION: A sample observation method includes an acquisition step for acquiring an electronic image of a sample, and a subtraction step for subtracting a DC component from an electronic image signal. The acquisition step is carried out in a bright-field observation mode. The electronic image in the subtraction step is an image acquired in a predetermined condition. A position of the sample and a focal position of an imaging optical system are matched using light in a first wavelength range before being brought into the predetermined condition, and an optical image of the sample is formed using light in a second wavelength range at least in the predetermined condition. The second wavelength range either coincides with a portion of the first wavelength range or is different from the first wavelength range.
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Inventors:
Yoshimasa Suzuki
Application Number:
JP2013040143A
Publication Date:
October 25, 2017
Filing Date:
February 28, 2013
Export Citation:
Assignee:
Olympus Endo Technology America Inc.
International Classes:
G02B21/00; G02B21/02; H04N5/225
Domestic Patent References:
| JP2010148391A | ||||
| JP2008102294A | ||||
| JP2007155982A | ||||
| JP2011530094A | ||||
| JP2009145754A | ||||
| JP2004354650A |
Foreign References:
| WO2006051813A1 | ||||
| US5463426 |
Other References:
U.AGERO ET AL,"Cell surface fluctuations studied with defocusing microscopy",PHYSICAL REVIEW E,2003年 5月,Vol.67, no.5,051904-1~051904-9
Attorney, Agent or Firm:
Keisuke Saito
Iwao Hirayama
Iwao Hirayama