Title:
ABNORMALITY DETECTING DEVICE, METHOD FOR CONTROLLING ABNORMALITY DETECTING DEVICE, INFORMATION PROCESSING PROGRAM, AND RECORDING MEDIUM
Document Type and Number:
WIPO Patent Application WO/2020/054496
Kind Code:
A1
Abstract:
The objective of the present invention is to detect an abnormality in an actuator using a displacement time of a movable portion, irrespective of the ambient temperature and the type of actuator. An abnormality detecting device (10) determines an abnormality using characteristic values (W1 and W2), which are values obtained by subtracting minimum values (T1min and T2min) of a movement time from maximum values (T1MAX and T2MAX) thereof, and dividing the resulting values by initial values (T10 and T20) of the movement time.
Inventors:
TSUKIKAWA MASAYOSHI (JP)
SHIRAMIZU GAKU (JP)
KIMURA KATSUYUKI (JP)
SHIRAMIZU GAKU (JP)
KIMURA KATSUYUKI (JP)
Application Number:
PCT/JP2019/034520
Publication Date:
March 19, 2020
Filing Date:
September 03, 2019
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO (JP)
International Classes:
F15B20/00; F15B15/28
Foreign References:
| JP2004133857A | 2004-04-30 | |||
| JPH10281113A | 1998-10-20 | |||
| JPH02212043A | 1990-08-23 | |||
| JPH09208147A | 1997-08-12 | |||
| JP2018119679A | 2018-08-02 | |||
| US5486997A | 1996-01-23 |
Attorney, Agent or Firm:
MURAKAMI, Takashi (JP)
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