Title:
ABNORMALITY DETECTION DEVICE, ABNORMALITY DETECTION METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/204092
Kind Code:
A1
Abstract:
Provided are an abnormality detection device, etc., whereby it is possible to detect an abnormality in a resonance sensor signal outputted by an optical deflector in accordance with swinging of a mirror part. Provided is an abnormality detection device for detecting an abnormality in a resonance sensor signal outputted by a sensor unit of an optical deflector (1), the abnormality detection device comprising a resonance sensor signal processing unit (50) having a function for A/D conversion of the resonance sensor signal outputted by the sensor unit into resonance sensor signal data and a function for outputting the resonance sensor signal data after data acquisition completion and A/D conversion, a resonance sensor signal predicted data calculation unit (133d4) for calculating predicted data for the resonance sensor signal, and a resonance sensor signal abnormality determination unit (133d5) for comparing the predicted data for the resonance sensor signal and the actual resonance sensor signal data when the mirror part is in a resonant state and detecting an abnormality in the resonance sensor signal on the basis of the result of the comparison.
Inventors:
SUINA KENJI (JP)
Application Number:
PCT/JP2023/014631
Publication Date:
October 26, 2023
Filing Date:
April 10, 2023
Export Citation:
Assignee:
STANLEY ELECTRIC CO LTD (JP)
International Classes:
G02B26/10; G02B26/08
Foreign References:
| JP2010097092A | 2010-04-30 | |||
| JP2015132768A | 2015-07-23 | |||
| US20200403626A1 | 2020-12-24 |
Attorney, Agent or Firm:
IEIRI Takeshi (JP)
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