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Patent Searching and Data


Title:
ABNORMALITY DETECTION DEVICE AND ABNORMALITY DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/276101
Kind Code:
A1
Abstract:
The present invention comprises: cameras 81, 82 that capture images of a material 1 being rolled, which is to be subjected to rolling abnormality detection, during the rolling of the material 1 being rolled; a brightness reference value setting unit 91 that extracts the material 1 being rolled from at least one image captured by the cameras 81, 82 and determines a brightness reference value with which it is determined that there is no abnormality in the material 1 being rolled from the brightness data of pixels within the area of the material 1 being rolled; and an image processing unit 92 that establishes one or more images among the one or more captured images as comparison images, extracts the material 1 being rolled from each of the comparison images, and detects a surface rolling abnormality on the basis of the brightness difference between the brightness data within the area of the material 1 to be rolled and the brightness reference value. Thus provided are an abnormality detection device and an abnormality detection method with which sheet rolling abnormality detection accuracy can be improved in comparison to conventional devices and methods.

Inventors:
MOCHIZUKI CHITOSHI (JP)
OMURA AKIHIRO (JP)
KANEMORI SHINYA (JP)
YAMADA MASAHIRO (JP)
Application Number:
PCT/JP2021/024917
Publication Date:
January 05, 2023
Filing Date:
July 01, 2021
Export Citation:
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Assignee:
PRIMETALS TECH JAPAN LTD (JP)
International Classes:
B21B38/00; G01N21/892
Foreign References:
JP2010078574A2010-04-08
JPH06167576A1994-06-14
JP2010085096A2010-04-15
Other References:
See also references of EP 4257258A4
Attorney, Agent or Firm:
KAICHI IP (JP)
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