Title:
ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2019/163776
Kind Code:
A1
Abstract:
This abnormality determination device comprises: an analysis unit that analyzes a characteristic amount related to a pattern in an image, such characteristic amount being from encoded information which is of an encoded image in which at least the cover of a manhole has been imaged; and a determination unit that determines whether there is an abnormality in the manhole cover on the basis of the analysis results of the analysis unit.
Inventors:
TAKAGI MOTOHIRO (JP)
HAYASE KAZUYA (JP)
MITASAKI TOKINOBU (JP)
SHIMIZU ATSUSHI (JP)
HAYASE KAZUYA (JP)
MITASAKI TOKINOBU (JP)
SHIMIZU ATSUSHI (JP)
Application Number:
PCT/JP2019/006105
Publication Date:
August 29, 2019
Filing Date:
February 19, 2019
Export Citation:
Assignee:
NIPPON TELEGRAPH & TELEPHONE (JP)
International Classes:
G06T7/00
Foreign References:
| JP2016095235A | 2016-05-26 | |||
| JP2015099563A | 2015-05-28 | |||
| JP2015197376A | 2015-11-09 | |||
| JP2015099112A | 2015-05-28 | |||
| JP2015191572A | 2015-11-02 | |||
| JP2015059768A | 2015-03-30 |
Other References:
MURASAKI, KAZUHIKO ET AL.: "Manhole cover wearing estimation via vertical plane segmentation", IEICE TECHNICAL REPORT, vol. 117, no. 211, 2017, pages 205 - 212
Attorney, Agent or Firm:
SHIGA INTERNATIONAL PATENT OFFICE (JP)
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