Title:
ABNORMALITY DETERMINATION DEVICE, ABNORMALITY DETERMINATION METHOD, AND ABNORMALITY DETERMINATION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/034577
Kind Code:
A1
Abstract:
An abnormality determination device according to the present disclosure includes: a calculation unit that calculates a resistance value of a heater; a comparison unit that compares the resistance value in the past calculated by the calculation unit and the resistance value presently calculated; and a detection unit that detects an abnormality of the heater when a comparison value in the comparison unit has exceeded a threshold value.
Inventors:
TSUDA YUTO (JP)
TOKUSHIGE JUN (JP)
AKITA MARINO (JP)
TAKATSUKI RYOTA (JP)
TOKUSHIGE JUN (JP)
AKITA MARINO (JP)
TAKATSUKI RYOTA (JP)
Application Number:
PCT/JP2023/028790
Publication Date:
February 15, 2024
Filing Date:
August 07, 2023
Export Citation:
Assignee:
NHK SPRING CO LTD (JP)
International Classes:
H05B3/00; B82B1/00
Domestic Patent References:
| WO2013042488A1 | 2013-03-28 | |||
| WO2020136958A1 | 2020-07-02 |
Foreign References:
| JP2009283332A | 2009-12-03 | |||
| JP2015172626A | 2015-10-01 | |||
| JP2021535573A | 2021-12-16 | |||
| JPH06176857A | 1994-06-24 |
Attorney, Agent or Firm:
TAIYO, NAKAJIMA & KATO (JP)
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