Title:
ABNORMALITY FACTOR ESTIMATION DEVICE, LEARNING DEVICE, PRECISE DIAGNOSTIC SYSTEM, AND ABNORMALITY FACTOR ESTIMATION METHOD
Document Type and Number:
WIPO Patent Application WO/2024/053030
Kind Code:
A1
Abstract:
The present invention involves: a sensor data acquisition unit (10) that acquires a plurality of sets of time-series sensor data collected by a plurality of sensors (300) provided in a plurality of facility components constituting a target facility; an abnormality detection unit (30) that detects a plurality of abnormality-detecting sensors that are experiencing abnormality on the basis of the plurality of sets of sensor data; an abnormality detection order estimation unit (40) that estimates the abnormality detection order in which the plurality of abnormality-detecting sensors have been detected as experiencing abnormality; an abnormality propagation path tracing unit (50) that estimates the abnormality propagation order in which an abnormality has propagated on the basis of abnormality-detecting sensor information regarding the plurality of abnormality-detecting sensors and an estimated structure that shows dependencies between the facility components; and an abnormality factor estimation unit (60) that estimates factors for the abnormality on the basis of the abnormality detection order and the abnormality propagation order.
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Inventors:
MORIYAMA TAKERU (JP)
Application Number:
PCT/JP2022/033628
Publication Date:
March 14, 2024
Filing Date:
September 08, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B23/02; G01M99/00; G06N5/04; G06N20/00; G06Q50/04
Domestic Patent References:
| WO2021241578A1 | 2021-12-02 | |||
| WO2018198267A1 | 2018-11-01 | |||
| WO2018146768A1 | 2018-08-16 |
Foreign References:
| JP2010067177A | 2010-03-25 | |||
| JP6935046B1 | 2021-09-15 |
Attorney, Agent or Firm:
SANNO PATENT ATTORNEYS OFFICE (JP)
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