Title:
ABNORMALITY PREDICTION DEVICE, ABNORMALITY PREDICTION SYSTEM, ABNORMALITY PREDICTION METHOD, AND ABNORMALITY PREDICTION PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/248373
Kind Code:
A1
Abstract:
This abnormality prediction device (100) comprises a deterioration prediction unit (120). When a subject component provided to a subject device is deemed at a subject time to have deteriorated and the subject component at the subject time is deemed to be a subject deteriorated component, in a case in which there is a difference between the relative position of a drive unit corresponding to the subject deteriorated component relative to another component and the relative position of the drive unit corresponding to the subject component relative to the other component while the subject component has not deteriorated, and in which it is estimated that an abnormality will occur in the subject device due to the subject deteriorated component deteriorating further and the distance between the drive unit corresponding to the subject component and the other component reaching an abnormal distance, the deterioration prediction unit (120) predicts the point in time at which the abnormality will occur in the subject device on the basis of a remaining distance, which is the difference between the abnormal distance and the distance between the drive unit corresponding to the subject deteriorated component and the other component.
Inventors:
SHIBATA KOJI (JP)
Application Number:
PCT/JP2022/024849
Publication Date:
December 28, 2023
Filing Date:
June 22, 2022
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B23/02
Domestic Patent References:
| WO2022004417A1 | 2022-01-06 | |||
| WO2020174828A1 | 2020-09-03 |
Foreign References:
| JP2021149397A | 2021-09-27 | |||
| JP2000259222A | 2000-09-22 |
Attorney, Agent or Firm:
CROSS-BORDER PATENT FIRM (JP)
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