Title:
ANALYSIS DEVICE AND ANALYSIS METHOD
Document Type and Number:
WIPO Patent Application WO/2011/093090
Kind Code:
A1
Abstract:
Provided are an analysis device and an analysis method with which variations in measurement values in surface-enhanced Raman spectroscopy can be reduced. The disclosed analysis device (1) includes: a magnetic-flux concentration member (31) that concentrates magnetic flux on a reaction vessel into which an analyte and a reagent containing marker particles, which consist of magnetic particles and metal nanoparticles, have been dispensed, to thereby produce an aggregate by the aggregation of composites formed between the reagent and a substance-to-be-measured contained in the analyte; and a photometer unit (33) that spectrally separates and measures the Raman-scattered light which is generated by irradiating the aggregate with a laser beam emitted from a laser-beam source. The analysis device and the analysis method using same analyze the analyte on the basis of the surface-enhanced Raman-scattered light measured by the photometer unit. The analysis device (1) limits the amount of energy of the laser beam applied to the aggregate in a unit time and in a unit area to 0.001 to 0.005 mW/μm2.
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Inventors:
KIKKAWA EMIKO (JP)
MIZUTANI TAKAYUKI (JP)
MIZUTANI TAKAYUKI (JP)
Application Number:
PCT/JP2011/000474
Publication Date:
August 04, 2011
Filing Date:
January 28, 2011
Export Citation:
Assignee:
BECKMAN COULTER INC (US)
KIKKAWA EMIKO (JP)
MIZUTANI TAKAYUKI (JP)
KIKKAWA EMIKO (JP)
MIZUTANI TAKAYUKI (JP)
International Classes:
G01N21/65
Domestic Patent References:
WO2008116093A2 | 2008-09-25 |
Foreign References:
JP2004103108A | 2004-04-02 | |||
JP2008116432A | 2008-05-22 | |||
JP6105224B2 | 2017-03-29 | |||
JPH083465B2 | 1996-01-17 | |||
JP2007256414A | 2007-10-04 | |||
JP2005009969A | 2005-01-13 | |||
JP2005281355A | 2005-10-13 | |||
JP2001091521A | 2001-04-06 |
Attorney, Agent or Firm:
YAMAMOTO, Shusaku et al. (JP)
Shusaku Yamamoto (JP)
Shusaku Yamamoto (JP)
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Claims: