Title:
ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2011/118309
Kind Code:
A1
Abstract:
Provided is an analysis device which can handle analyzing various components while preventing the size of the device from enlarging. An analysis device (1) is provided with a light-emitting unit (10), a transmission spectral filter (22), a light detector (23), and an analyzing unit (31). The spectral filter (22) is provided with a translucent substrate, a plurality of protrusions formed from a first metal material on one surface of the substrate, and a metal film which is formed from a second metal material having a higher refractive index than that of the first metal material and which is formed so as to cover the aforementioned surface along with the protrusions. The protrusions are arranged so that the metal film located between the protrusions functions as a diffraction grating, and the protrusions function as a waveguide. The grating period of the diffraction grating, the height of the protrusions, and the thickness of the metal film are set to have a different value for each section of the spectral filter so that the wavelength of the transmitted light from the spectral filter is varied at each section. The light detector (23) is disposed in a manner such that each light-receiving element (24) can received the transmitted light from the spectral filter. The analyzing unit (31) acquires the spectrum of an object (40) by means of the output signal of the light-receiving elements (24).
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Inventors:
KAMIMURA IPPEI (JP)
Application Number:
PCT/JP2011/053668
Publication Date:
September 29, 2011
Filing Date:
February 21, 2011
Export Citation:
Assignee:
NEC SYSTEM TECHNOLOGIES LTD (JP)
KAMIMURA IPPEI (JP)
KAMIMURA IPPEI (JP)
International Classes:
G01N35/00; G01J3/36; G01J3/51; G01N21/27; G01N21/35; G01N21/3577; G01N21/359; G02B5/18
Foreign References:
| JP2009534700A | 2009-09-24 | |||
| JP2007501391A | 2007-01-25 | |||
| JP2010051589A | 2010-03-11 | |||
| JP2006170669A | 2006-06-29 | |||
| JP2007255969A | 2007-10-04 | |||
| JPH04313007A | 1992-11-05 | |||
| JP2006012826A | 2006-01-12 | |||
| JP2002196123A | 2002-07-10 |
Other References:
KYORITSU SHUPPAN CO., LTD.: "Bunkogakuteki Seishitsu o Shu toshita Kiso Bussei Zuhyo", 15 May 1972, KYORITSU SHUPPAN CO., LTD., pages: 202, 471 - 500, XP008169489
Attorney, Agent or Firm:
ONEDEE IP PARTNERS (JP)
Patent business corporation Wang Dee IP partners (JP)
Patent business corporation Wang Dee IP partners (JP)
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Claims: