Title:
APPARATUS AND METHOD FOR MEASURING ROAD FLATNESS
Document Type and Number:
WIPO Patent Application WO/2013/051786
Kind Code:
A1
Abstract:
According to exemplary embodiments of the present invention, the apparatus and method for measuring road flatness are provided, the method comprising obtaining an image of a road, obtaining the road flatness by dividing the image of the road into a plurality of areas, calculating an average brightness from each of the plurality of areas, and comparing the average brightness from each of the plurality of areas with a threshold, and displaying an image relative to the road flatness.
Inventors:
KIM JUNGHUN (KR)
Application Number:
PCT/KR2012/006696
Publication Date:
April 11, 2013
Filing Date:
August 23, 2012
Export Citation:
Assignee:
LG INNOTEK CO LTD (KR)
KIM JUNGHUN (KR)
KIM JUNGHUN (KR)
International Classes:
B60W40/06; B60R11/04; G06T7/00
Domestic Patent References:
| WO2009027089A2 | 2009-03-05 |
Foreign References:
| JPH09292213A | 1997-11-11 | |||
| US6658137B1 | 2003-12-02 | |||
| JP2009181544A | 2009-08-13 | |||
| JPH0546242A | 1993-02-26 |
Attorney, Agent or Firm:
JIN, Cheon Woong et al. (Deuk-Young Bldg. 423-5,Dogokdong, Gangnam-Gu, Seoul 135-855, KR)
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