Title:
APPARATUS AND METHOD FOR TESTING CONDUCTIVITY OF GRAPHENE
Document Type and Number:
WIPO Patent Application WO/2015/126111
Kind Code:
A1
Abstract:
According to the present invention, oxidized and reduced regions of graphene can be accurately detected in a short time using a terahertz wave so as to measure the conductivity of graphene, and thus the time required to test the conductivity of graphene can be reduced. In addition, when an oxidized region exists in graphene, the oxidized region can be immediately reduced by irradiating an electromagnetic wave thereto so as to increase the conductivity of graphene and thus minimize the time required to restore graphene.
Inventors:
KIM HAK-SUNG (KR)
PARK SUNG HYEON (KR)
KIM DOHYOUNG (KR)
PARK SUNG HYEON (KR)
KIM DOHYOUNG (KR)
Application Number:
PCT/KR2015/001532
Publication Date:
August 27, 2015
Filing Date:
February 16, 2015
Export Citation:
Assignee:
IUCF HYU (KR)
International Classes:
G01N21/3581
Foreign References:
| KR20130114617A | 2013-10-18 | |||
| US20100200755A1 | 2010-08-12 | |||
| KR20130099600A | 2013-09-06 | |||
| US20130342279A1 | 2013-12-26 | |||
| US20110292373A1 | 2011-12-01 |
Attorney, Agent or Firm:
JUNG, Eun Youl (KR)
정은열 (KR)
정은열 (KR)
Download PDF: