Title:
APPEARANCE DEFECT DETECTION METHOD, ELECTRONIC DEVICE, AND STORAGE MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/045963
Kind Code:
A1
Abstract:
The present disclosure relates to the field of defect detection, and in particular to an appearance defect detection method, an electronic device, and a storage medium. The appearance defect detection method comprises: for each point site in at least one point site of a target object, acquiring an appearance image of the point site, carrying out first detection on the appearance image of the point site, determining whether a preset defect is present in the appearance of the point site, and when the preset defect is present in the appearance of the point site, determining whether a defect is present in the appearance of the target object according to the type of the preset defect.
Inventors:
FENG PENGBO (CN)
XIE XUEZHI (CN)
ZHANG FUQIANG (CN)
LI HUIFU (CN)
XIE XUEZHI (CN)
ZHANG FUQIANG (CN)
LI HUIFU (CN)
Application Number:
PCT/CN2023/109564
Publication Date:
March 07, 2024
Filing Date:
July 27, 2023
Export Citation:
Assignee:
GOERTEK INC (CN)
International Classes:
G06T7/00
Domestic Patent References:
| WO2021079727A1 | 2021-04-29 |
Foreign References:
| CN115456969A | 2022-12-09 | |||
| CN110415214A | 2019-11-05 | |||
| CN109544506A | 2019-03-29 | |||
| CN110018166A | 2019-07-16 |
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