Title:
ARTIFICIAL INTELLIGENCE MODEL-BASED ABNORMALITY DIAGNOSIS METHOD, AND ABNORMALITY DIAGNOSIS DEVICE AND FACTORY MONITORING SYSTEM USING SAME
Document Type and Number:
WIPO Patent Application WO/2024/049194
Kind Code:
A1
Abstract:
An abnormality diagnosis device according to one embodiment of the present invention is located within a factory monitoring system, and may comprise: at least one processor; and a memory storing at least one command executed through the at least one processor. The at least one command may comprise: a command for receiving image data about an inspection object from an image sensor; and a command for diagnosing abnormality in the inspection object using the received image data and a pre-trained artificial intelligence-based diagnostic model.
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Inventors:
KIM KI GON (KR)
SHIN SUNG CHANG (KR)
YOO SEUNG JO (KR)
LEE JAEWOOK (KR)
LIM SANG MIN (KR)
SHIN SUNG CHANG (KR)
YOO SEUNG JO (KR)
LEE JAEWOOK (KR)
LIM SANG MIN (KR)
Application Number:
PCT/KR2023/012873
Publication Date:
March 07, 2024
Filing Date:
August 30, 2023
Export Citation:
Assignee:
LG ENERGY SOLUTION LTD (KR)
International Classes:
G05B23/02; G05B19/048; G06F3/048; G06N3/08; G06Q50/10; G06T7/00
Domestic Patent References:
| WO2021185404A1 | 2021-09-23 |
Foreign References:
| KR20220023726A | 2022-03-02 | |||
| US20210265673A1 | 2021-08-26 | |||
| KR20220050255A | 2022-04-25 | |||
| KR20220072303A | 2022-06-02 |
Attorney, Agent or Firm:
CHOI, Hee-Kyeong (KR)
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