Title:
AUTHENTICITY DETERMINATION MEMBER AND AUTHENTICITY DETERMINATION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2021/241226
Kind Code:
A1
Abstract:
The authenticity determination member includes: a base material layer, which is a reflective circular polarizer; a first printed layer provided on the base material layer, comprising a resin pigment that is a fragment from a resin layer A1 having cholesteric regularity; and a second printed layer provided on the base material layer, comprising a metal pigment having no circularly polarized light separation function. The authenticity determination method for the authenticity determination member comprises: the step (1) of injecting a nonpolarized light from one main surface of the authenticity determination member, to perform an observation and obtain a reflected image (1); the step (2) of injecting a nonpolarized light from the other main surface of the authenticity determination member, to perform an observation and obtain a reflected image (2); and the step (3) of determining that the reflected image (1) and the reflected image (2) are different.
Inventors:
HARAI KENICHI (JP)
Application Number:
PCT/JP2021/018013
Publication Date:
December 02, 2021
Filing Date:
May 12, 2021
Export Citation:
Assignee:
ZEON CORP (JP)
International Classes:
B41M3/14; B42D25/364; G02B5/30; G07D7/12
Domestic Patent References:
WO2008032411A1 | 2008-03-20 |
Foreign References:
JP2013008113A | 2013-01-10 | |||
JP2014174471A | 2014-09-22 | |||
JP2004338257A | 2004-12-02 | |||
JP2000255200A | 2000-09-19 | |||
US20200049871A1 | 2020-02-13 | |||
JP2013008113A | 2013-01-10 | |||
JP2005289881A | 2005-10-20 | |||
JP2004115414A | 2004-04-15 | |||
JP2003066214A | 2003-03-05 | |||
JP2003313187A | 2003-11-06 | |||
JP2003342219A | 2003-12-03 | |||
JP2000290315A | 2000-10-17 | |||
JPH0672962A | 1994-03-15 | |||
US6468444B1 | 2002-10-22 | |||
US9800428B2 | 2017-10-24 | |||
JP2007176870A | 2007-07-12 | |||
JP2015027743A | 2015-02-12 |
Attorney, Agent or Firm:
SAKAI INTERNATIONAL PATENT OFFICE (JP)
Download PDF: