Title:
AUTOMATED ANALYSIS DEVICE AND CLEANING METHOD
Document Type and Number:
WIPO Patent Application WO/2017/145672
Kind Code:
A1
Abstract:
A cleaning tank 113, 108, 106 includes: a cleaning water discharge port 203 which discharges cleaning water supplied from a cleaning water supply mechanism 123 into the cleaning tank 113, 108, 106; and a compressed air discharge port 204 which is disposed on the trajectory of the cleaning water discharged from the cleaning water discharge port 203 and which causes compressed air supplied from a compressed air supply mechanism 124 to be discharged toward a sample probe 111b or a reagent probe 120 inserted into the cleaning tank 113, 108, 106. There is thus provided a highly reliable automated analysis device and a method for cleaning probes with which it is possible to remove residual cleaning water on the outer wall surface of the probe without contaminating the outer wall surface of the probe, and without enlarging the cleaning tank.
Inventors:
MURAMATSU YOSHIKI (JP)
YASUI AKIHIRO (JP)
SUZUKI YOSHIHIRO (JP)
ARUGA YOICHI (JP)
YASUI AKIHIRO (JP)
SUZUKI YOSHIHIRO (JP)
ARUGA YOICHI (JP)
Application Number:
PCT/JP2017/003475
Publication Date:
August 31, 2017
Filing Date:
January 31, 2017
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/10
Foreign References:
| JP2013134142A | 2013-07-08 | |||
| JP2014085285A | 2014-05-12 | |||
| JP2005241442A | 2005-09-08 | |||
| JP2011078881A | 2011-04-21 | |||
| JPS62242858A | 1987-10-23 |
Other References:
See also references of EP 3422017A4
Attorney, Agent or Firm:
KAICHI IP (JP)
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