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Patent Searching and Data


Title:
AUTOMATED ANALYSIS DEVICE, AND LIQUID SURFACE DETECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2023/188812
Kind Code:
A1
Abstract:
The present invention provides an automated analysis device and a liquid surface detection method capable of detecting a liquid surface position of a sample regardless of a saturation and transparency of the sample. An automated analysis device according to the present invention comprises: a rack conveying path (141) for transporting a sample rack (2) accommodating a sample container (3) containing a sample (4); a camera (5) provided to the side of the rack conveying path (141); and a control unit (10) for controlling the rack conveying path (141) and the camera (5). The control unit (10) stops the transportation of the sample rack (2) being transported by the rack conveying path (141), the sample container (3) accommodated in the sample rack (2) of which transportation has been stopped is imaged a plurality of times by the camera (5) to acquire a plurality of captured images of the sample container (3), differential images of the plurality of captured images are created, and a region having the largest surface area among regions having a time variation in the differential images is defined as a position of a liquid surface (41) of the sample (4).

Inventors:
OCHI MANABU (JP)
KAWAHARA TETSUJI (JP)
SUZUKI YOICHIRO (JP)
TAKAYAMA HIROYUKI (JP)
MUKAIYAMA NAOKI (JP)
FUNATSU TERUNOBU (JP)
YOSHIKAWA KEIKO (JP)
TAMEZANE HIDETO (JP)
Application Number:
PCT/JP2023/003524
Publication Date:
October 05, 2023
Filing Date:
February 03, 2023
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G01N35/02
Foreign References:
JP2012008077A2012-01-12
Attorney, Agent or Firm:
POLAIRE I.P.C. (JP)
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