AUTOMATED ANALYZER AND AUTOMATED ANALYSIS METHOD

Title:

AUTOMATED ANALYZER AND AUTOMATED ANALYSIS METHOD

Document Type and Number:

WIPO Patent Application WO/2019/130668

Kind Code:

A1

Abstract:

The present invention makes it possible for an automated analyzer comprising two or more types of photometers to obtain suitable output of the measurement results of the plurality of photometers and suitable data alarm output even if there is an abnormality, or the like, at the time of measurement. This automated analyzer comprises, for example, two types of photometers having different quantitative ranges and an analysis control unit for controlling analysis that includes measurement of a given sample using the two types of photometers. If two types of data alarms corresponding to abnormalities, or the like, during measurement have been added to the two types of measurement results from the two types of photometers (step S204(C)), the analysis control unit selects measurement result and data alarm output corresponding to the combination of the two types of data alarms and outputs the same to a user as analysis results (step S205).

Inventors:

KAZAMA YUTO (JP)
IIJIMA MASAHIKO (JP)
YABUTANI CHIE (JP)
KOGURE KENJI (JP)

Application Number:

PCT/JP2018/032999

Publication Date:

July 04, 2019

Filing Date:

September 06, 2018

Export Citation:

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Assignee:

HITACHI HIGH TECH CORP (JP)

International Classes:

G01N35/00; G01N35/02

Domestic Patent References:

WO2010027037A1

2010-03-11

Foreign References:

JP2000221198A	2000-08-11
JPH08262031A	1996-10-11
JP2012233807A	2012-11-29
JP2014006160A	2014-01-16
JP2015021952A	2015-02-02
JPS6312964A	1988-01-20
JP2014006160A	2014-01-16

Other References: