AUTOMATIC PROFILE GENERATION ON TEST MACHINE

WIPO Patent Application WO/2024/004174

A1

A test evaluation method according to the present disclosure includes: providing, on a virtual base, a first configuration for calculating actual data; setting a first measurement device for the first configuration; obtaining first data for the first configuration with the first measurement device; providing a second configuration in which one device in the first configuration has been replaced by a simulator; setting a second measurement device for the second configuration; obtaining second data for the second configuration with the second measurement device; and obtaining a differential profile for the first data and the second data.　The method may also include: evaluating the quality of the first configuration corresponding to a version of software for the first device, in accordance with the differential profile; including the quality evaluation of the first configuration in a release process ticket; and learning the relationship between the version and the number of bugs on the basis of the contents of the release process ticket.

WO/2011/120216	METHOD, SYSTEM AND PROCESSOR FOR PERFORMING COUNT OF INSTRUCTION EXECUTION TIMES
WO/1992/012477	GRAPHICAL DISPLAY OF COMPILER GENERATED INTERMEDIATE DATABASES
WO/2019/169725	TEST DATA GENERATION METHOD, DEVICE, AND APPARATUS, AND COMPUTER READABLE STORAGE MEDIUM

NAKAZATO JIN (JP)
KUCHITSU MITSUHIRO (JP)
TANAKA SAKI (JP)
HORIUCHI HARUKA (JP)
TAKAMI KEISUKE (JP)

PCT/JP2022/026386

January 04, 2024

June 30, 2022

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RAKUTEN MOBILE INC (JP)

G06F11/36

JP2017135653A	2017-08-03
JP2005020420A	2005-01-20
JP2005149043A	2005-06-09
JP2021117666A	2021-08-10
JP2000322283A	2000-11-24

SATO, Kimio et al. (JP)

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