BLAST FURNACE ABNORMALITY DETERMINATION DEVICE, BLAST FURNACE ABNORMALITY DETERMINATION METHOD, BLAST FURNACE OPERATION METHOD, BLAST FURNACE OPERATION SYSTEM, BLAST FURNACE ABNORMALITY DETERMINATION SERVER DEVICE, PROGRAM FOR BLAST FURNACE ABNORMALITY DETERMINATION SERVER DEVICE, AND DISPLAY TERMINAL DEVICE

WIPO Patent Application WO/2023/190234

A1

This blast furnace abnormality determination device comprises: a sensor signal acquisition means for acquiring measurement data of a plurality of sensors installed at different positions in a blast furnace; an evaluation index calculation means for calculating a unified evaluation index indicating a furnace condition state from the measurement data acquired by the sensor signal acquisition means; an evaluation index difference value calculation means for calculating an evaluation index difference value, which is the absolute value of the time difference of evaluation indices calculated by the evaluation index calculation means; and a determination means for determining an abnormality of the blast furnace on the basis of the evaluation index difference value calculated by the evaluation index difference value calculation means, and outputting the determined results and the data used in the determination.

JPS56117080	METHOD OF MEASURING LOCATION OF SURFACE LAYER OF CHARGE IN VERTICAL EURNACE
JP4604401	Receiving method and receiving device
JPS58217613	MEASUREMENT OF HARMONIC MEAN PARTICLE SIZE OF RAW MATERIAL TO BE CHARGED TO BLAST FURNACE

SHIMAMOTO HIROYUKI (JP)
YAMAGUCHI TATSUYA (JP)
TSUJI MASASHI (JP)

PCT/JP2023/011980

October 05, 2023

March 24, 2023

Click for automatic bibliography generation  

JFE STEEL CORP (JP)

C21B7/24; C21B5/00

WO2021033721A1

2021-02-25

JP2021165414A

2021-10-14

SAKAI INTERNATIONAL PATENT OFFICE (JP)

View/Download PDF      PDF Help

Previous Patent: HEAT PUMP DEVICE

Next Patent: ADHESIVE FILM FOR SEMICONDUCTORS, DICING/DIE-BONDING FILM, AND METHOD FOR MANUFACTURING SEMICONDUCTO...