Title:
CALIBRATION DEVICE, CALIBRATION METHOD, AND TEST EQUIPMENT
Document Type and Number:
WIPO Patent Application WO/2008/047683
Kind Code:
A1
Abstract:
A calibration device calibrates a jitter measurement circuit including a jitter signal
generation unit for generating a jitter signal in which the duration of at least
one of a logical H or a logical L changes according to the jitter of an input signal
and an integration unit for integrating the jitter signal by charging and discharging,
according to a logical value of the jitter signal, a capacitor with a predetermined
current and outputting a jitter measurement signal based on the jitter amount
of the input signal. The calibration device comprises a current control unit
for supplying the integration unit with at least one of a predetermined charge
current or discharge current for charging or discharging the capacitor, a voltage
measurement unit for measuring the voltage variation of the capacitor while
the current control unit is supplying the charge current or discharge current,
and a gain calculation unit for calculating the gain of the integration unit according
to the voltage variation measured by the voltage measurement unit.
Inventors:
ISHIDA MASAHIRO (JP)
Application Number:
PCT/JP2007/069870
Publication Date:
April 24, 2008
Filing Date:
October 11, 2007
Export Citation:
Assignee:
ADVANTEST CORP (JP)
ISHIDA MASAHIRO (JP)
ISHIDA MASAHIRO (JP)
International Classes:
G01R29/02; G01R35/00
Domestic Patent References:
| WO2004031784A1 | 2004-04-15 |
Foreign References:
| JPS62148882A | 1987-07-02 | |||
| JP2006227009A | 2006-08-31 |
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo 05, JP)
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