Title:
MEASURING APPARATUS, MEASURING METHOD, PROGRAM AND TESTING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2008/047684
Kind Code:
A1
Abstract:
A measuring apparatus for measuring a quadrature modulator comprises a supplying part
that supplies both a reference I-signal having a predetermined frequency and
a reference Q-signal the phase of which deviates by 90 degrees from that of the
reference I-signal to the quadrature modulator; an extracting part that extracts,
from modulated signals outputted by the quadrature modulator quadrature having
quadrature modulated the reference I- and Q-signals, main signal components in
which the reference I- and Q-signals have been modulated and that also extracts image
signal components occurring at symmetrical positions with respect to the modulated
reference I- and Q-signals and carrier signals; and a measurement value calculating
part that calculates, based on the main signal components and image signal components,
at least one of a carrier phase error, which occurs between the I- and Q-signal
sides, an amplitude error of the I- and Q-signal sides and a skew between the I-
and Q-signals in the quadrature modulator.
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Inventors:
ASAMI KOJI (JP)
Application Number:
PCT/JP2007/069871
Publication Date:
April 24, 2008
Filing Date:
October 11, 2007
Export Citation:
Assignee:
ADVANTEST CORP (JP)
ASAMI KOJI (JP)
ASAMI KOJI (JP)
International Classes:
H04L27/00
Foreign References:
| JPH04274642A | 1992-09-30 | |||
| JPH05136836A | 1993-06-01 | |||
| JPH05130156A | 1993-05-25 |
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chom, Shinjuku-ku Tokyo 05, JP)
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