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Patent Searching and Data


Title:
CAPACITANCE MEASUREMENT CIRCUIT AND METHOD, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/017135
Kind Code:
A1
Abstract:
Embodiments of the present application relate to the technical field of robots. Disclosed are a capacitance measurement circuit and method, and an electronic device, applied to detection of electronic skin. The method comprises: measuring a first capacitance value of a first capacitor bank, a second capacitance value of a second capacitor bank, and a third capacitance value of a third capacitor bank, the first capacitor bank comprising a capacitor element to be measured and a row capacitor element to be measured, the second capacitor bank comprising the capacitor element to be measured and a column capacitor element to be measured, and the third capacitor bank comprising the row capacitor element to be measured and the column capacitor element to be measured; and according to the first capacitance value, the second capacitance value, and the third capacitance value, obtaining the capacitance value of the capacitor element to be measured. Therefore, during calculation of the capacitance value of the capacitor element to be measured, the effect of the capacitance values of the row capacitor element to be measured and the column capacitor element to be measured on the capacitance value of the capacitor element to be measured is considered, so that the measured capacitance value is more accurate.

Inventors:
DAI YUAN (CN)
ZHANG RUIRUI (CN)
CHEN KE (CN)
LAI JIE (CN)
LIU SIYUAN (CN)
ZHANG ZHENGYOU (CN)
Application Number:
PCT/CN2021/103066
Publication Date:
January 27, 2022
Filing Date:
June 29, 2021
Export Citation:
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Assignee:
TENCENT TECH SHENZHEN CO LTD (CN)
International Classes:
H03K17/975
Foreign References:
CN111504521A2020-08-07
CN105743483A2016-07-06
CN110262704A2019-09-20
US20050141263A12005-06-30
Other References:
See also references of EP 4099568A4
Attorney, Agent or Firm:
DEQI INTELLECTUAL PROPERTY LAW CORPORATION (CN)
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