CAPACITANCE REFERENCE LINE UPDATE METHOD, AND CHIP AND CAPACITANCE MEASUREMENT APPARATUS

Title:

CAPACITANCE REFERENCE LINE UPDATE METHOD, AND CHIP AND CAPACITANCE MEASUREMENT APPARATUS

Document Type and Number:

WIPO Patent Application WO/2022/165816

Kind Code:

A1

Abstract:

A capacitance reference line update method, and a chip and a capacitance measurement apparatus. The method is applied to a capacitance measurement apparatus. The method comprises: according to an nth frame of raw capacitance data and an (n-M)th frame of raw capacitance data output by a capacitance measurement apparatus, determining a feature value corresponding to the nth frame of raw capacitance data; calculating a difference value between the nth frame of raw capacitance data and a reference line value corresponding to an (n-1)th frame of raw capacitance data output by the capacitance measurement apparatus, so as to obtain a capacitance change amount; and when the feature value corresponding to the nth frame of raw capacitance data is less than a first threshold value Thr1, and the capacitance change amount is less than a proximity threshold value Thron, determining the nth frame of raw capacitance data or the (n-1)th frame of raw capacitance data as a reference line value corresponding to the nth frame of raw capacitance data. By means of the method and apparatus, a capacitance reference line value can be effectively updated in real time.

Inventors:

AI JUAN (CN)

Application Number:

PCT/CN2021/075882

Publication Date:

August 11, 2022

Filing Date:

February 07, 2021

Export Citation:

Click for automatic bibliography generation Help

Assignee:

SHENZHEN GOODIX TECH CO LTD (CN)

International Classes:

G01R27/26

Foreign References:

CN102855032A	2013-01-02
CN101963873A	2011-02-02
US20200133412A1	2020-04-30
CN109601015A	2019-04-09
CN111190507A	2020-05-22

Other References: