CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS

Title:

CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS

Document Type and Number:

WIPO Patent Application WO/2011/087490

Kind Code:

A3

Abstract:

An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer positioned to allow the probe to be partially inserted into the component without contacting the pins. The spacer may be a collar on the probe that contacts the housing of the component, contacts the substrate of the circuit assembly, or both. In some other embodiments, the spacer may be a riser extending beyond the surface of the sense plate that contacts the component, a riser portion of the component, or a combination of both. The spacer improves sensitivity by establishing a small gap between a sense plate of the probe and pins under test without risk of damage to the pins. A second feature is a guard plate of the probe with reduced capacitance to a sense plate of the probe. Reducing capacitance also increases the sensitivity of the probe.

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Inventors:

SUTO ANTHONY J (US)

Application Number:

PCT/US2010/003238

Publication Date:

November 17, 2011

Filing Date:

December 21, 2010

Export Citation:

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Assignee:

TERADYNE INC (US)
SUTO ANTHONY J (US)

International Classes:

G01R27/26

Foreign References:

US20010000947A1	2001-05-10
US20040012400A1	2004-01-22
US20060125501A1	2006-06-15
US20060043991A1	2006-03-02
KR20020096094A	2002-12-31
JP2005233858A	2005-09-02

Other References: