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Patent Searching and Data


Title:
COMPACT IN-PLANE MULTIAXIAL STRETCHING TESTER AND METHOD OF COMPACT IN-PLANE MULTIAXIAL STRETCHING TESTING
Document Type and Number:
WIPO Patent Application WO/2006/109371
Kind Code:
A1
Abstract:
Compact in-plane multiaxial stretching testing means; and a method of compact in-plane multiaxial stretching testing for sheetlike structures. There is provided a method of in-plane multiaxial stretching testing for sheetlike structures, comprising mounting sheetlike structure (1) having one surface and an opposite surface on support table (3) adapted to mount the same with either the one or opposite surface selected as a mounting surface directed thereto, gripping edges of the sheetlike structure (1) protruding from the support table (3) by means of gripper (2), and moving the gripper (2) in the direction of departing from the mounting surface so that the sheetlike structure (1) in the state of being bent on the side of mounting surface on the fulcrum of marginal portions of the support table (3) is stretched to thereby produce an in-plane deformation. Further, there is provided a relevant compact in-plane multiaxial stretching tester. By the use of the in-plane multiaxial stretching tester, while stretching the sheetlike structure, there can be realized stress measurement and measuring of any structural change of molecules within the sheetlike structure.

Inventors:
TOKI SHIGEYUKI (JP)
SICS IGORS (US)
Application Number:
PCT/JP2006/303384
Publication Date:
October 19, 2006
Filing Date:
February 24, 2006
Export Citation:
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Assignee:
TOKI SHIGEYUKI (JP)
SICS IGORS (US)
International Classes:
G01N3/28
Foreign References:
US2966792A1961-01-03
JPH02181629A1990-07-16
JP2001153821A2001-06-08
JPH01197953A1989-08-09
US4901581A1990-02-20
Attorney, Agent or Firm:
Arai, Nobuaki (Daini-Futaba Bldg. No. 601, 13-11, Shiba 5-choume, Minato-k, Tokyo 14, JP)
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