Title:
COMPUTE-IN-MEMORY CHIP AND CONTROL METHOD
Document Type and Number:
WIPO Patent Application WO/2023/245823
Kind Code:
A1
Abstract:
Disclosed in the present application are a compute-in-memory chip and a control method. The method comprises: acquiring environmental data around a vehicle; when a preset safety level is satisfied, a first neural network unit outputting a similarity to a plurality of environments according to the input environmental data; and according to the similarity to the plurality of environments, acquiring a network level of a hidden layer and neuron nodes of the hidden layer, a plurality of neuron nodes of an input layer, a plurality of neuron nodes of an output layer, and a closed transmission channel, and a second neural network outputting a control instruction according to the similarity to the plurality of environments.
Inventors:
HUANG STANLEY (CN)
ZHANG RAIN (CN)
ZHANG RAIN (CN)
Application Number:
PCT/CN2022/109925
Publication Date:
December 28, 2023
Filing Date:
August 03, 2022
Export Citation:
Assignee:
SHEN ZHEN XINCUN TECH CO LTD (CN)
International Classes:
B60W60/00; B60W40/00; B60W40/02; B60W50/00; G06N3/04; G06N3/063; G06N3/08
Foreign References:
| CN111611197A | 2020-09-01 | |||
| CN111081067A | 2020-04-28 | |||
| US5285523A | 1994-02-08 | |||
| CN114274980A | 2022-04-05 | |||
| CN111923919A | 2020-11-13 |
Attorney, Agent or Firm:
SHENZHEN NENGWEN INTELLECTUAL PROPERTY AGENCY (GENERAL PARTNERSHIP) (CN)
Download PDF:
Previous Patent: TEST STRUCTURE, FORMATION METHOD THEREFOR AND SEMICONDUCTOR MEMORY
Next Patent: TEST METHOD AND TEST APPARATUS FOR MEMORY
Next Patent: TEST METHOD AND TEST APPARATUS FOR MEMORY