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Title:
CONTACT FORCE MEASURING DEVICE AND CONTACT FORCE MEASURING METHOD
Document Type and Number:
WIPO Patent Application WO/2010/084919
Kind Code:
A1
Abstract:
Provided are a contact force measuring device and a contact force measuring method which are capable of accurately measuring the contact forces of both a pantograph (4) such as a single-arm pantograph, which has a few springs (6), and a pantograph (4) with a multi-divided contact strip, which has many springs (6).  In the contact force measuring device and the contact force measuring method, an image capturing means comprising an area camera (2) or the like for capturing an image of the spring (6) of the pantograph (4) after improving time resolution by partially defining an image capturing region, an image processing means comprising a processing PC (8) for detecting the spring (6) in the image by image processing, and a contact force calculating means comprising a processing PC (8) for finding contact force by adding the spring reaction force of the spring (6) detected by the image processing means and inertial force are provided.

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Inventors:
FUJISAWA TAKAMASA (JP)
NIWAKAWA MAKOTO (JP)
WATABE YUSUKE (JP)
IKEDA MITSURU (JP)
Application Number:
PCT/JP2010/050722
Publication Date:
July 29, 2010
Filing Date:
January 21, 2010
Export Citation:
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Assignee:
MEIDENSHA ELECTRIC MFG CO LTD (JP)
RAILWAY TECHNICAL RES INST (JP)
FUJISAWA TAKAMASA (JP)
NIWAKAWA MAKOTO (JP)
WATABE YUSUKE (JP)
IKEDA MITSURU (JP)
International Classes:
B60L5/24; G01L5/00
Foreign References:
JP2008185457A2008-08-14
JP2001235310A2001-08-31
JP2008298532A2008-12-11
JP2008252461A2008-10-16
JP2006246307A2006-09-14
JP2002279409A2002-09-27
JPH11328419A1999-11-30
JP2008109375A2008-05-08
JP2007286943A2007-11-01
JP2008104312A2008-05-01
Attorney, Agent or Firm:
MITSUISHI Toshiro et al. (JP)
Toshiro Mitsuishi (JP)
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