PANTOGRAPH HEIGHT MEASURING DEVICE AND CALIBRATION METHOD THEREFOR

WIPO Patent Application WO/2010/084920

A1

Provided is a pantograph height measuring device which enables easy calibration in the measurement of the height of a pantograph (10a).  Also provided is a calibration method thereof.  The pantograph height measuring device is provided with a line sensor (20) installed on the roof of a car (10), a processing computer (30) for analyzing an image captured by the line sensor (20), and a calibration member (40) detachably provided within the range including the range of fluctuation of the pantograph (10a) and configured by disposing black regions (40b) and white regions (40w) alternately along a vertical direction, wherein the processing computer (30) finds an approximate expression for calculating the height of an overhead wire, the approximate expression being an expression indicating the relationship between the positions of the black regions (40b) and the white regions (40w) obtained from an image of the calibration member (40), which is captured by the line sensor (20), in the image, and the actual heights of the black regions (40b) and the white regions (40w).

JPH10336802	SINGLE-ARMED PANTOGRAPH
JP4271004	Pantograph device
JP5885303	Scraped plate local wear detector and its local wear detection program

FUJISAWA TAKAMASA (JP)
NIWAKAWA MAKOTO (JP)
WATABE YUSUKE (JP)

PCT/JP2010/050723

July 29, 2010

January 21, 2010

Click for automatic bibliography generation  

MEIDENSHA ELECTRIC MFG CO LTD (JP)
FUJISAWA TAKAMASA (JP)
NIWAKAWA MAKOTO (JP)
WATABE YUSUKE (JP)

B60L5/26; G01B11/02; G06T1/00

WO2008044389A1

2008-04-17

JP2008104312A	2008-05-01
JP2001133225A	2001-05-18
JPH02248805A	1990-10-04
JP2006250774A	2006-09-21

MITSUISHI Toshiro et al. (JP)
Toshiro Mitsuishi (JP)

View/Download PDF      PDF Help

Previous Patent: CONTACT FORCE MEASURING DEVICE AND CONTACT FORCE MEASURING METHOD

Next Patent: ANALYSIS SYSTEM, ANALYSIS DEVICE, VESSEL, ANALYSIS METHOD, PROGRAM, AND RECORDING MEDIUM