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Title:
COUNTERFEIT PREVENTION STRUCTURE BODY AND FABRICATION METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2014/077329
Kind Code:
A1
Abstract:
A counterfeit prevention structure body (10) comprises a microscopic unevenness forming layer (11), further comprising first regions (13) which include optical elements which have unevenness structures with a depth-to-width ratio, which is a ratio of depth to width thereof, which is greater than or equal to a first value, and second regions (14) which include optical elements which have unevenness structures with a depth-to-width ratio which is less than the first value. The first regions (13) have a higher translucence than the second regions (14). The counterfeit prevention structure body (10) further comprises particles (15) whereby depression parts of the unevenness structures which the first regions (13) include are filled, and reflective layers (12) which are positioned upon the unevenness structures which the second regions (14) include.

Inventors:
YASHIKI KAZUHIRO (JP)
Application Number:
PCT/JP2013/080819
Publication Date:
May 22, 2014
Filing Date:
November 14, 2013
Export Citation:
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Assignee:
TOPPAN PRINTING CO LTD (JP)
International Classes:
G02B5/18; B42D25/30; B42D25/328; B42D25/40; G02B5/08
Domestic Patent References:
WO2010147185A12010-12-23
Foreign References:
JP2011173379A2011-09-08
JP2009063703A2009-03-26
JP2003255115A2003-09-10
JP2008530600A2008-08-07
JP2012063738A2012-03-29
JP2007112988A2007-05-10
JP2007115356A2007-05-10
JPH0237543A1990-02-07
Other References:
See also references of EP 2921888A4
Attorney, Agent or Firm:
ONDA, Makoto et al. (JP)
Makoto Onda (JP)
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