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Patent Searching and Data


Title:
CT FOCAL POINT DETERMINATION METHOD AND SYSTEM
Document Type and Number:
WIPO Patent Application WO/2019/041223
Kind Code:
A1
Abstract:
A method for determining a CT focal point (118) includes determining a first intensity of first radiation incident on a first detector unit (422-1, 422-3) of a scanner (110), wherein the scanner (110) may include a non-uniform anti-scatter grid (117) and a radiation source (115), and the non-uniform ASG (117) may be configured according to a first focal point (425) of the radiation source (115). The method also includes determining a second intensity of second radiation incident on a second detector unit (422-2, 422-4) of the scanner (110), wherein the first radiation and the second radiation are emitted from the radiation source (115) with a second focal point (426). The method further includes determining a displacement of the second focal point (426) from the first focal point (425) based on the first intensity and the second intensity.

Inventors:
JIANG YIFENG (CN)
Application Number:
PCT/CN2017/099899
Publication Date:
March 07, 2019
Filing Date:
August 31, 2017
Export Citation:
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Assignee:
SHENZHEN UNITED IMAGING HEALTHCARE CO LTD (CN)
International Classes:
A61B6/03
Foreign References:
CN103997967A2014-08-20
CN103852777A2014-06-11
CN103140172A2013-06-05
US20160199019A12016-07-14
US6175609B12001-01-16
Other References:
See also references of EP 3675741A4
Attorney, Agent or Firm:
METIS IP (CHENGDU) LLC (CN)
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