Title:
DATA PROCESSING METHOD AND APPARATUS, DATA DISPLAY METHOD AND APPARATUS, AND DEVICE AND MEDIUM
Document Type and Number:
WIPO Patent Application WO/2024/000356
Kind Code:
A1
Abstract:
The present invention relates to a data processing method and apparatus, a data display method and apparatus, and a device and a medium. In the present invention, a plurality of pieces of measurement data of display panels to be tested are acquired, so as to determine, on the basis of target parameter values determined from the plurality of pieces of measurement data, data type information for indicating whether target measurement data of a plurality of optical display panels has a multi-group characteristic and/or obeys a normal distribution, and thus a control limit of a target control image can be determined on the basis of the data type information, such that the determined control limit better satisfies the real data type of data, thereby improving the accuracy of the determined control limit.
Inventors:
YANG KUN (CN)
WEN JING (CN)
CHEN CHIAFENG (CN)
XU XIAODONG (CN)
HE DECAI (CN)
WU JIANMIN (CN)
WANG HONG (CN)
WEN JING (CN)
CHEN CHIAFENG (CN)
XU XIAODONG (CN)
HE DECAI (CN)
WU JIANMIN (CN)
WANG HONG (CN)
Application Number:
PCT/CN2022/102675
Publication Date:
January 04, 2024
Filing Date:
June 30, 2022
Export Citation:
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
BEIJING ZHONGXIANGYING TECH CO LTD (CN)
BEIJING ZHONGXIANGYING TECH CO LTD (CN)
International Classes:
G05B19/418
Foreign References:
| CN110987493A | 2020-04-10 | |||
| CN109100117A | 2018-12-28 | |||
| CN102540944A | 2012-07-04 | |||
| CN114429256A | 2022-05-03 | |||
| TWI266249B | 2006-11-11 |
Other References:
CHEN JIAFENG, YANG QINYUE, XIE JIABING, WANG LEI, HUANG YUAN, YANG KAIXIN: "Refined Management-Discussion on the Establishment of SPC Control Charts Based on Differences in Process Equipment", DIANZI SHIJIE - ELECTRONICS WORLD, DIANZI SHIJIE ZAZHISHE, CN, no. 20, 30 October 2019 (2019-10-30), CN , pages 5 - 9, XP009551578, ISSN: 1003-0522, DOI: 10.19353/j.cnki.dzsj.2019.20.001
TIAN, WENXING: "Research on Statistical Process Control of Nested Process Parameters in Semiconductor Manufacturing", INFORMATION & TECHNOLOGY, CHINA MASTER'S THESES FULL-TEXT DATABASE, 15 March 2017 (2017-03-15)
TIAN, WENXING: "Research on Statistical Process Control of Nested Process Parameters in Semiconductor Manufacturing", INFORMATION & TECHNOLOGY, CHINA MASTER'S THESES FULL-TEXT DATABASE, 15 March 2017 (2017-03-15)
Attorney, Agent or Firm:
BEIJING BESTIPR INTELLECTUAL PROPERTY LAW CORPORATION (CN)
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