Title:
DATA PROCESSING METHOD, MEASURING SYSTEM, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/119370
Kind Code:
A1
Abstract:
Provided is a data processing method for synthetic aperture processing employing a Fourier transform, the method being simple and having excellent processing speed, even with respect to a structure having a curved surface shape. In this data processing method for analyzing scattered waves of waves emitted onto an object: waves are emitted onto the object from a plurality of transmission points p1(x'1, y'1, z'1) arranged two-dimensionally on an xy plane; scattered waves reflected with a reflection coefficient f(x, y, z) at a reflection point (x, y, z) on the object are received at a plurality of reception points p2(x'2, y'2, z'2) arranged two-dimensionally on the xy plane, as measured values s(x'1, x'2, y'1, y'2, z'1, z'2, k); the measured values s(x'1, x'2, y'1, y'2, z'1, z'2, k) are subjected to a quadruple Fourier transform to obtain S(k'x1, k'x2, k'y1, k'y2, z'1, z'2, k), which is subjected to a triple reverse Fourier transform to obtain the reflection coefficient f(x, y, z).
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Inventors:
MORI YASUNARI (JP)
Application Number:
PCT/JP2021/047053
Publication Date:
June 29, 2023
Filing Date:
December 20, 2021
Export Citation:
Assignee:
MITSUI E & S MACH CO LTD (JP)
International Classes:
G01N22/02; G01N22/00
Domestic Patent References:
| WO2021020387A1 | 2021-02-04 | |||
| WO2017149582A1 | 2017-09-08 |
Foreign References:
| JP2018138880A | 2018-09-06 | |||
| JPH03188391A | 1991-08-16 |
Attorney, Agent or Firm:
GLOBAL IP TOKYO (JP)
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