Title:
DATA PROCESSING METHOD, MEASUREMENT SYSTEM, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2023/119369
Kind Code:
A1
Abstract:
Provided is a simple data processing method offering excellent calculation speed, even for structures that have a curved shape, in synthetic aperture processing using Fourier transform. This data processing method for analyzing scattered waves from waves emitted at an object includes: emitting waves at an object from a plurality of transmitting/receiving points p(x', y', z') arrayed over a curve of a single-valued function z'=g(x', y') pertaining to (x', y') in a plane parallel to the yz-plane; receiving scattered waves reflected with a reflectance f(x, y, z) at reflection points (x, y, x) on the object as measured values sa(x', y', k) at the transmitting/receiving points p(x', y', z') from which the waves were emitted; running the measured values sa(x', y', k) through double Fourier transform to find Sa(kx, ky, k); defining an operator having the eigenvalue (x', y') with respect to Sa(kx, ky, k); and running through a triple inverse Fourier transform to find the reflectance f(x, y, z).
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Inventors:
MORI YASUNARI (JP)
Application Number:
PCT/JP2021/047050
Publication Date:
June 29, 2023
Filing Date:
December 20, 2021
Export Citation:
Assignee:
MITSUI E & S MACH CO LTD (JP)
International Classes:
G01N22/00
Domestic Patent References:
| WO2021020387A1 | 2021-02-04 | |||
| WO2017149582A1 | 2017-09-08 |
Foreign References:
| JP2018138880A | 2018-09-06 | |||
| JPH03188391A | 1991-08-16 |
Attorney, Agent or Firm:
GLOBAL IP TOKYO (JP)
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