Title:
DEFECT DETECTION METHOD AND APPARATUS, AND ELECTRONIC DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/179012
Kind Code:
A1
Abstract:
A defect detection method and apparatus, and an electronic device. The method comprises: acquiring an image of an object to be subjected to detection (S1100); acquiring brightness information of a pixel in the image (S1200); and according to the brightness information, obtaining appearance defect information of said object, wherein the appearance defect information represents a defect present in the appearance of said object (S1300). By means of the method, an electronic device can quickly and accurately obtain appearance defect information of an object to be subjected to detection, thereby saving on manpower, and improving the user experience.
Inventors:
GAI ZENGYUAN (CN)
CHI XIAOYU (CN)
CHI XIAOYU (CN)
Application Number:
PCT/CN2021/102053
Publication Date:
September 01, 2022
Filing Date:
June 24, 2021
Export Citation:
Assignee:
GOERTEK INC (CN)
International Classes:
G06T7/00
Foreign References:
| CN112862800A | 2021-05-28 | |||
| CN103218961A | 2013-07-24 | |||
| CN108364291A | 2018-08-03 | |||
| CN110619368A | 2019-12-27 | |||
| CN106093073A | 2016-11-09 | |||
| CN106292180A | 2017-01-04 | |||
| CN111721302A | 2020-09-29 |
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