DEFECT REPAIR METHOD AND DEFECT REPAIR DEVICE FOR PHOTOVOLTAIC ELEMENT

WIPO Patent Application WO/2013/051433

A1

Provided is a defect repair method in which, in the process of manufacturing a thin-film solar cell, locations at which a short-circuit may occur as a result of a defect caused by pin holes are insulated in advance and an electrical short-circuit is prevented irrespective of the size, number, and distribution of the pin holes, whereby the manufacturing yield can be improved and production efficiency can be increased. The defect repair method includes: a defect detection step for detecting pin holes (20) penetrating through two semiconductor layers (13), (14) before layering a second electrode layer (15) in a photovoltaic element (10) formed by sequentially stacking a light-transmitting first electrode layer (12), two semiconductor layers (13), (14), and a second electrode layer (15) on a light-transmitting insulating substrate (11); and a material application step for discharging an insulating material (41), using an inkjet head (40), to positions at which the pin holes (20) detected in the defect detection step are present.

NAGATA TAKESHI
INUI HITOSHI
NAKANISHI YASUNORI
HAYASHI YUTAKA

PCT/JP2012/074608

April 11, 2013

September 26, 2012

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SHARP KK (JP)
NAGATA TAKESHI
INUI HITOSHI
NAKANISHI YASUNORI
HAYASHI YUTAKA

H01L31/076; H01L31/20

WO1993023881A1	1993-11-25
WO2010052884A1	2010-05-14

JPH04336471A	1992-11-24
US4451970A	1984-06-05
JP2009195968A	2009-09-03
JP2002203978A	2002-07-19
JP2011243970A	2011-12-01

YONETSU, Kiyoshi et al. (JP)
Kiyoshi Yonezu (JP)

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