Title:
DELAY MEASUREMENT CIRCUIT AND CONTROL METHOD THEREFOR
Document Type and Number:
WIPO Patent Application WO/2023/231143
Kind Code:
A1
Abstract:
The present application relates to a delay measurement circuit and a control method therefor. A control link module is configured to have an input terminal connected to an output terminal and is used for, according to a received first enable signal, sequentially generating a plurality of control signals having a cycle time T; a target oscillation module receives a second enable signal, wherein the second enable signal is delayed by a first preset threshold compared with the first enable signal; each stage of target unit in the target oscillation module is configured to, according to a received control signal, be disconnected from a ground/power supply terminal within a first preset time T1, and then connected to the ground/power supply terminal in a second preset time T2, wherein the first preset time T1 is a level inversion time of the target unit, and the second preset time T2 is a logic level holding time of the target unit, so as to reduce leakage current of the target unit in the first preset time T1; T1+T2=T/2; N is an odd number. Mutual impact between action currents of two adjacent stages of target units is avoided, and the performance and reliability of ring oscillators are improved.
Inventors:
HOU CHUANGMING (CN)
Application Number:
PCT/CN2022/104374
Publication Date:
December 07, 2023
Filing Date:
July 07, 2022
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
H03K3/03
Foreign References:
| JP2015198320A | 2015-11-09 | |||
| CN102761316A | 2012-10-31 | |||
| CN101257290A | 2008-09-03 | |||
| US20040263192A1 | 2004-12-30 | |||
| US20070018738A1 | 2007-01-25 |
Attorney, Agent or Firm:
ADVANCE CHINA IP LAW OFFICE (CN)
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