DETECTION METHOD FOR ALLERGY-CAUSING SUBSTANCE AND SCREENING METHOD FOR ALLERGY INHIBITOR

Title:

DETECTION METHOD FOR ALLERGY-CAUSING SUBSTANCE AND SCREENING METHOD FOR ALLERGY INHIBITOR

Document Type and Number:

WIPO Patent Application WO/2006/115234

Kind Code:

A1

Abstract:

Disclosed is a method for detecting an allergy-causing substance rapidly and reliably. A method for detecting a substance that causes the degranulation in a mammal-derived mast cell or basophile, the method being characterized by using a mammal-derived mast cell or basophile having a gene encoding a fusion protein of a protein which can be secreted into a granule in a mammal-derived mast cell or basophile and a marker protein introduced therein.

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Inventors:

IMAI SHINJIRO (JP)

Application Number:

PCT/JP2006/308485

Publication Date:

November 02, 2006

Filing Date:

April 17, 2006

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Assignee:

NISSHIN SEIFUN GROUP INC (JP)
IMAI SHINJIRO (JP)

International Classes:

C12Q1/02; C12N5/10; C12N15/09; G01N33/15; G01N33/50

Domestic Patent References:

WO2004016212A2

2004-02-26

Attorney, Agent or Firm:

Hiraki, Yusuke (3-20 Toranomon 4-chom, Minato-ku Tokyo 01, JP)

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