DEVICE-UNDER-TEST RETAINING APPARATUS, AND EMC TEST SYSTEM

WIPO Patent Application WO/2021/192876

A1

With conventional device-under-test retaining apparatuses, because a hoisting unit is present above the device under test, the device under test cannot be flight-operated above the hoisting unit, and therefore, for example, the range over which the device under test can travel vertically ends up being smaller than the length from the floor to the ceiling of the RF anechoic chamber, thereby making it difficult for the device under test to fly by using the space in the RF anechoic chamber effectively while being retained so as to restrict travel of the device under test to prevent collision with other equipment.　In this device-under-test retaining apparatus (100), provided are standards (1) that surround a space in which the directions in which a device under test (10), which is the subject of an EMC test, travels under flight are open, and retaining components (4) that retain the device under test (10) and each have fixed-side connecting parts (7) connected to a plurality of fixed-end parts (6) provided on the standards (1) and a device-connecting part (8) connected to the device under test (10).

KOBAYASHI RYOTA (JP)
HIROSE KENJI (JP)
OTSUKA KYOTA (JP)
SASAKI YUICHI (JP)

PCT/JP2021/008315

September 30, 2021

March 04, 2021

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MITSUBISHI ELECTRIC CORP (JP)

G01R29/08

WO2020008582A1

2020-01-09

JP2018203409A	2018-12-27
JP2000187052A	2000-07-04
JP2001159647A	2001-06-12
JPH10501624A	1998-02-10
EP3133418A1	2017-02-22
CN102087322A	2011-06-08
KR101386638B1	2014-04-18

SANNO PATENT ATTORNEYS OFFICE (JP)

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