Title:
DIAGNOSTIC SYSTEM, INFORMATION PROCESSING DEVICE, DIAGNOSTIC METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2024/075567
Kind Code:
A1
Abstract:
This diagnostic system (1) comprises: an operation state information acquisition unit that acquires operation state information that indicates an operation state of a machining facility (2) to be diagnosed; an extraction unit that extracts, from the operation state information that has been acquired by the operation state information acquisition unit, operation state information of a calculation target interval that indicates a time region that is determined according to a preset rule, in a stable machining interval in which a motor rotates in a stable manner; a feature amount calculation unit that calculates a feature amount from the operation state information of the calculation target interval that has been extracted by the extraction unit; and a diagnostic unit that determines, on the basis of the feature amount that has been calculated by the feature amount calculation unit, whether the machining facility 2 is normal or abnormal.
Inventors:
ISHIGURO YUKIHIRO (JP)
Application Number:
PCT/JP2023/034701
Publication Date:
April 11, 2024
Filing Date:
September 25, 2023
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
G05B23/02
Attorney, Agent or Firm:
KIMURA Mitsuru (JP)
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