Title:
DIFFRACTION RING FORMING DEVICE AND X-RAY DIFFRACTION MEASUREMENT DEVICE
Document Type and Number:
WIPO Patent Application WO/2014/128874
Kind Code:
A1
Abstract:
[Abstract] A diffraction ring forming device that is provided with a case (100) that incorporates an X-ray emitter for irradiating an object to be measured with X-rays and an imaging plate for recording a diffraction ring. The case (100) has mutually orthogonal flat walls (101, 102), parallel flat walls (103, 104) that intersect with flat walls (101, 102) at an angle of approximately 45 degrees, and a flat wall (105) that is perpendicular to flat walls (103, 104). The X-ray emitter is disposed in the case (100) such that the optical axis of the X-rays emitted by the X-ray emitter is contained in a plane perpendicular to each of flat walls (101, 102) and is parallel to each of flat walls (103, 104) and such that the angle of incidence with respect to flat wall (105) is at a prescribed angle in the vicinity of the line at which flat walls (101, 102) intersect when extended.
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Inventors:
MARUYAMA YOICHI (JP)
Application Number:
PCT/JP2013/054266
Publication Date:
August 28, 2014
Filing Date:
February 21, 2013
Export Citation:
Assignee:
PULSTEC IND CO LTD (JP)
International Classes:
G01N23/207; G01B15/06; G01L1/00
Foreign References:
| JP2013015414A | 2013-01-24 | |||
| JP2012122737A | 2012-06-28 | |||
| JPH06109669A | 1994-04-22 | |||
| JP2001013095A | 2001-01-19 |
Other References:
PULSTEC INDUSTRIAL CO., LTD.: "Others: Portable X-ray Residual Stress Analyzer", 4 February 2013 (2013-02-04), Retrieved from the Internet [retrieved on 20130306]
Attorney, Agent or Firm:
PROSPEC PATENT FIRM (JP)
Patent business corporation Pros Peck patent firm (JP)
Patent business corporation Pros Peck patent firm (JP)
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