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Patent Searching and Data


Title:
DIMENSION MEASUREMENT DEVICE AND DIMENSION MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2023/243287
Kind Code:
A1
Abstract:
Provided is technology with which it is possible to avoid or minimize the execution of dimensional measurement in an imaging environment that is not suitable for dimensional measurement. This dimension measurement device comprises a three-dimensional camera for acquiring three-dimensional positional information regarding the surface of an object to be measured, and a control unit for measuring the dimensions of the object to be measured on the basis of the three-dimensional information of the object to be measured placed on a placement platform. Before measuring the dimensions of the object to be measured, the control unit determines, on the basis of an image captured by the three-dimensional camera, whether or not the imaging environment of the placement stand is suitable for dimensional measurement (steps S36, S38).

Inventors:
NAKAJIMA YOSHIHIRO (JP)
YANAGIUCHI SAYURI (JP)
Application Number:
PCT/JP2023/018215
Publication Date:
December 21, 2023
Filing Date:
May 16, 2023
Export Citation:
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Assignee:
GLORY KOGYO KK (JP)
International Classes:
G01B11/03; G01B11/25; G06V20/00; H04N23/60
Domestic Patent References:
WO2008044389A12008-04-17
Foreign References:
JP2014163833A2014-09-08
JP2016114382A2016-06-23
JP2019082416A2019-05-30
Attorney, Agent or Firm:
NAKASHIMA, Ryou (JP)
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