Title:
DIMENSION MEASUREMENT SYSTEM, ESTIMATION SYSTEM AND DIMENSION MEASUREMENT METHOD
Document Type and Number:
WIPO Patent Application WO/2024/053043
Kind Code:
A1
Abstract:
Provided is a dimension measurement system or the like which uses a method in which a human inputs and sets some information while making it possible to reduce the manual operation time or burden for the human. This dimension measurement system involves: displaying, for a user, a screen which includes an image and a graphical user interface (GUI), designating a reference line (interface reference line) for identifying part of a region of a structure to be subjected to dimension measurement, on the basis of a manual user operation, on an image on the screen, and designating a reference point (region reference point) within said region, said point being for identifying the region of the structure to be subjected to the dimension measurement (step 3); detecting an outline or an edge of the region of the structure to be subjected to a dimension measurement in the image by using the reference line and the reference point (step 4); and measuring a dimension of the structure to be subjected to a dimension measurement in the image by using the detected outline or edge information (step 5).
Inventors:
SAWADA ATSUSHI (JP)
IKEUCHI AKIRA (JP)
IKEUCHI AKIRA (JP)
Application Number:
PCT/JP2022/033680
Publication Date:
March 14, 2024
Filing Date:
September 08, 2022
Export Citation:
Assignee:
HITACHI HIGH TECH CORP (JP)
International Classes:
G06T1/00; G01B21/02
Domestic Patent References:
| WO2010052855A1 | 2010-05-14 | |||
| WO2021024402A1 | 2021-02-11 |
Foreign References:
| JP2007024896A | 2007-02-01 | |||
| JP2013250106A | 2013-12-12 |
Attorney, Agent or Firm:
TSUTSUI & ASSOCIATES (JP)
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