Title:
DISPLAY SUBSTRATE, TESTING METHOD THEREFOR AND DISPLAY APPARATUS
Document Type and Number:
WIPO Patent Application WO/2017/041480
Kind Code:
A1
Abstract:
A display substrate, a testing method therefor and a display apparatus. The display substrate comprises a plurality of pixel regions arranged in a matrix and a testing unit. Each of the pixel regions is provided with a first electrode. The testing unit comprises at least two sub-testing units. First electrodes provided in a plurality of adjacent pixel regions correspond to electrode blocks (1). The various electrode blocks (1) are electrically isolated from each other. The electrode blocks (1) are divided into at least two testing groups of the same number as that of sub-testing units according to arrangement positions. The electrode blocks (1) belonging to the same testing group are all arranged at intervals in a row direction and a column direction, and all the electrode blocks in the same testing group are connected to one of the sub-testing units. The testing unit can precisely test a bad open circuit or a bad short circuit in a display substrate, thereby improving the testing precision and reducing the production costs.
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Inventors:
LI YANCHEN (CN)
WANG PANHUA (CN)
WANG PANHUA (CN)
Application Number:
PCT/CN2016/077344
Publication Date:
March 16, 2017
Filing Date:
March 25, 2016
Export Citation:
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
BEIJING BOE OPTOELECTRONICS TECH CO LTD (CN)
BEIJING BOE OPTOELECTRONICS TECH CO LTD (CN)
International Classes:
G02F1/1333; G02F1/13
Foreign References:
| CN105093593A | 2015-11-25 | |||
| CN104880840A | 2015-09-02 | |||
| CN102455960A | 2012-05-16 | |||
| CN103955309A | 2014-07-30 | |||
| US20030122975A1 | 2003-07-03 | |||
| JPH10268273A | 1998-10-09 |
Attorney, Agent or Firm:
TEE&HOWE INTELLECTUAL PROPERTY ATTORNEYS (CN)
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