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Patent Searching and Data


Title:
DUAL-MODE RESOLUTION CONVERSION DEVICE FOR THREE-DIMENSIONAL X-RAY MICROSCOPE
Document Type and Number:
WIPO Patent Application WO/2023/121414
Kind Code:
A1
Abstract:
The present invention relates to a dual-mode resolution conversion device for a three-dimensional X-ray microscope. A dual-mode resolution conversion device for a three-dimensional X-ray microscope, according to one embodiment of the present invention, comprises: a sample assembly in which a sample is fixed; a source unit that irradiates X-rays to the sample; a low magnification module unit that, when a low magnification mode is set, generates a low magnification image of the sample on the basis of the X-rays emitted from the sample to which the X-rays are irradiated; and a high magnification module unit that, when a high magnification mode is set, generates a high magnification image of the sample on the basis of the X-rays emitted from the sample to which the X-rays are irradiated, wherein the low magnification module unit moves so as to correspond to an optical axis of the X-rays when the low magnification mode is set, and the high magnification module unit moves so as to correspond to an optical axis of the X-rays when the high magnification mode is set.

Inventors:
LEE SANGSUL (KR)
CHOI JAEYEON (KR)
JUNG JINHEE (KR)
Application Number:
PCT/KR2022/021250
Publication Date:
June 29, 2023
Filing Date:
December 23, 2022
Export Citation:
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Assignee:
XAVISOPTICS LTD (KR)
POSTECH RES & BUSINESS DEV FOUND (KR)
International Classes:
G01N23/04; G01N23/083; G01N23/223
Domestic Patent References:
WO2019066051A12019-04-04
Foreign References:
KR20100091011A2010-08-18
US7170969B12007-01-30
KR20200052157A2020-05-14
KR20090063375A2009-06-18
Attorney, Agent or Firm:
G1 IP LAW FIRM (KR)
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