Title:
ELECTROMAGNETIC FIELD PROBE
Document Type and Number:
WIPO Patent Application WO/2018/179045
Kind Code:
A1
Abstract:
In a loop-shaped conductor (1), both ends are opened, one end section (1a) is connected to a conductor plate (2), and the other end section (1b) is connected to a lead-out line (5b). The conductor plate (2) is disposed in parallel to the loop surface of the loop-shaped conductor (1), and has a shape covering the loop-shaped conductor (1). A lead-out line (5a) is connected to the conductor plate (2), and outputs from the lead-out line (5a) and the lead-out line (5b) are specified as a measurement output of the electromagnetic field probe.
Inventors:
YAMAKAJI YUSUKE (JP)
OHASHI HIDEYUKI (JP)
MIYAZAKI CHIHARU (JP)
OHASHI HIDEYUKI (JP)
MIYAZAKI CHIHARU (JP)
Application Number:
PCT/JP2017/012363
Publication Date:
October 04, 2018
Filing Date:
March 27, 2017
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP (JP)
International Classes:
H01Q7/04; G01R29/08; G01R33/02
Domestic Patent References:
| WO2005096007A1 | 2005-10-13 |
Foreign References:
| JPH08248080A | 1996-09-27 | |||
| JP2000338206A | 2000-12-08 | |||
| JP2001102817A | 2001-04-13 | |||
| JP2010213195A | 2010-09-24 | |||
| JPH1172545A | 1999-03-16 |
Attorney, Agent or Firm:
TAZAWA, Hideaki et al. (JP)
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