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Title:
ELECTRON TUBE, ELECTRON TUBE MODULE, AND OPTICAL DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/014111
Kind Code:
A1
Abstract:
This electron tube is provided with a vacuum vessel having a light transmissive substrate, a photoelectric surface provided on an inner surface of the light transmissive substrate, an anode provided in the vacuum vessel, and a prism. The prism has a bottom surface bonded to an outer surface of the light transmissive substrate, a light incidence surface, and a light reflection surface at which light that has entered the photoelectric surface through the prism and the light transmissive substrate and been reflected at the interface between the photoelectric surface and the vacuum space is further reflected so that the light enters the photoelectric surface again. The light reflection surface has a curved shape that is convex outward. The light incidence surface is located inside a virtual spherical surface extending along the light reflection surface.

Inventors:
KONNO RINA (JP)
KOBAYASHI SHUNSUKE (JP)
SUGIURA GINJI (JP)
KONDO JUNICHI (JP)
MATSUOKA YASUMASA (JP)
Application Number:
PCT/JP2021/015209
Publication Date:
January 20, 2022
Filing Date:
April 12, 2021
Export Citation:
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Assignee:
HAMAMATSU PHOTONICS KK (JP)
International Classes:
H01J40/06; G01N21/64; G02B1/11; G02B5/04; G02B5/08; G02B5/10; G02B21/06; H01J1/34; H01J43/24
Domestic Patent References:
WO2019094441A12019-05-16
Foreign References:
JP2007184119A2007-07-19
JP2009277515A2009-11-26
JP2014522093A2014-08-28
Other References:
HIRSCHFELD TOMAS: "Procedures for Attenuated Total Reflection Study of Extremely Small Samples", APPLIED OPTICS, OPTICAL SOCIETY OF AMERICA, WASHINGTON, DC, US, vol. 6, no. 4, 1 April 1967 (1967-04-01), US , pages 715, XP055898272, ISSN: 0003-6935, DOI: 10.1364/AO.6.000715
J. B. OKERUDOLPH E. SCHILD: "A Practical Multiple Reflection Technique for Improving the Quantum Efficiency of Photomultiplier Tubes", APPLIED OPTICS, vol. 7, no. 4, 1968, pages 617 - 622
Attorney, Agent or Firm:
HASEGAWA Yoshiki et al. (JP)
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