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Patent Searching and Data


Title:
ELECTRONIC COMPONENT INSPECTION METHOD
Document Type and Number:
WIPO Patent Application WO/2022/209611
Kind Code:
A1
Abstract:
An electronic component (110) has a first surface (FC1) at which a first electrode (11) is provided, and a second surface (FC2) at which a second electrode (12) is provided. A measuring instrument has a first terminal (TM1) and a second terminal (TM2). Only the second surface (FC2) among the first surface (FC1) and the second surface (FC2) is adhered to an electroconductive adhesive sheet (310). The measuring instrument (200) takes a measurement of the electronic component (110) while the first terminal (TM1) of the measuring instrument (200) is electrically connected to the first electrode (11) at the first surface (FC1), and the second terminal (TM2) of the measuring instrument (200) is electrically connected to the second electrode (12) at the second surface (FC2) via the electroconductive adhesive sheet (310).

Inventors:
IKEDA RYUSUKE (JP)
HIBINO TOMOHIKO (JP)
OHNISHI TAKAO (JP)
Application Number:
PCT/JP2022/009766
Publication Date:
October 06, 2022
Filing Date:
March 07, 2022
Export Citation:
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Assignee:
NGK INSULATORS LTD (JP)
International Classes:
G01R27/02; G01N27/20; G01R29/22
Domestic Patent References:
WO2020066936A12020-04-02
WO2019054337A12019-03-21
WO2020262256A12020-12-30
WO2021095511A12021-05-20
Foreign References:
JP2019004184A2019-01-10
JP2016025142A2016-02-08
JP2020102615A2020-07-02
JP2007129776A2007-05-24
JPH0933334A1997-02-07
Attorney, Agent or Firm:
YOSHITAKE Hidetoshi et al. (JP)
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